Test time reduction for scan-designed circuits by sliding compatibility

Resource

Computers and Digital Techniques, IEE Proceedings-

Journal

Computers and Digital Techniques, IEE Proceedings-

Pages

-

Date Issued

1995-01

Date

1995-01

Author(s)

Chang, J.-S.

Lin, C.-S.

DOI

1350-2387

URI

Type

journal article

File(s)

Name

00350877.pdf

Size

658.22 KB

Format

Adobe PDF

Checksum

(MD5):8f90dca724bf87929a18011385c48734