A Circuit Design for the Improvement of Radiation Hardness in CMOS Digital Circuits

Journal

IEEE Transactions on Nuclear Science

Journal Volume

39

Journal Issue

2

Pages

272-277

Date Issued

1992

Author(s)

Chen, C.-C.

Liu, S.-C.

Hsiao, C.-C.

Hwu, J.-G.

DOI

10.1109/23.277496

URI

http://www.scopus.com/inward/record.url?eid=2-s2.0-0026852503&partnerID=MN8TOARS

http://scholars.lib.ntu.edu.tw/handle/123456789/296945

Type

journal article