散射式掃描近場光學顯微鏡一次十奈米級光學檢測

Other Title

Scattering-Type Scanning Near-Field Optical Microscopy-Optical Characterization in sub-10 nm Scale

Journal

科儀新知

Journal Issue

163

Pages

35-45

Date Issued

2008

Author(s)

朱仁佑

汪天仁

張祐嘉

葉吉田

DOI

10.29662/IT.200804.0005

URI

https://scholars.lib.ntu.edu.tw/handle/123456789/496556

Type

journal article