Evidence of Si/SiGe heterojunction roughness scattering

Resource

Applied Physics Letters 85 (21): 4947

Journal

Applied Physics Letters

Journal Volume

85

Journal Issue

21

Pages

-

Date Issued

2004

Date

2004

Author(s)

Liu, C. W.

Lee, M. H.

Lee, Y. C.

Chen, P. S.

Yu, C.-Y.

Wei, J.-Y.

Maikap, S.

URI

Type

journal article

File(s)

Name

49.pdf

Size

301.68 KB

Format

Adobe PDF

Checksum

(MD5):f0d54bda794d4e3fc77d5aed220c808e