HyHOPE: fast fault simulator with efficient simulation of hypertrophic faults

Resource

Circuits, Devices and Systems, IEE Proceedings-

Journal

Circuits, Devices and Systems, IEE Proceedings-

Pages

-

Date Issued

1995-02

Date

1995-02

Author(s)

Kung, C.-P.

Lin, C.-S.

DOI

1350-2409

URI

Type

journal article

File(s)

Name

00365550.pdf

Size

801.48 KB

Format

Adobe PDF

Checksum

(MD5):58f3b871834ae3cf0d949a4c5359d242