IEEE 1500 Compatible Secure Test Wrapper For Embedded IP Cores
Journal
International Test Conference
Date Issued
2008-01
Author(s)
Abstract
This poster presents a secure test wrapper (STW) design that is compatible with IEEE 1500 standard. STW protects not only internal scan chains but also primary inputs and outputs, which may contain critical information such as encryption keys. To reduce the STW area, flip-flops in the wrapper boundary cells are configured as an LFSR to generate the gold key. Experimental results on AES show that STW provides very high security (2 257 ) at the price of about 5% area overhead with respect to the original IEEE 1500 standard test wrapper.
SDGs
Type
conference paper