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College of Electrical Engineering and Computer Science / 電機資訊學院
Electronics Engineering / 電子工程學研究所
IEEE 1500 Compatible Secure Test Wrapper For Embedded IP Cores
Details
IEEE 1500 Compatible Secure Test Wrapper For Embedded IP Cores
Journal
International Test Conference
Date Issued
2008-01
Author(s)
CHIEN-MO LI
Geng-Ming Chiu
C.-Y. Chiu
R-Y. Wen
CHIEN-MO LI
DOI
10.1109/TEST.2008.4700683
URI
http://scholars.lib.ntu.edu.tw/handle/123456789/343012
SDGs
[SDGs]SDG9
Type
conference paper
