Mechanically strained strained-Si NMOSFETs

Resource

IEEE Electron Device Letters 25 (1): 40-42

Journal

IEEE Electron Device Letters

Journal Volume

25

Journal Issue

1

Pages

40-42

Date Issued

2004

Date

2004

Author(s)

Maikap, S.

Yu, C.-Y.

Jan, S.-R.

Lee, M.H.

Liu, C.W.

URI

Type

journal article

File(s)

Name

44.pdf

Size

185.86 KB

Format

Adobe PDF

Checksum

(MD5):8e38018544ff0df37d01ea62859af937