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College of Electrical Engineering and Computer Science / 電機資訊學院
Electronics Engineering / 電子工程學研究所
Transition Fault Diagnosis Using At-speed Scan Patterns with Multiple Capture Clocks
Details
Transition Fault Diagnosis Using At-speed Scan Patterns with Multiple Capture Clocks
Journal
VLSI/CAD
Date Issued
2008-01
Author(s)
CHIEN-MO LI
Shang-Feng Chao
CHIEN-MO LI
URI
http://scholars.lib.ntu.edu.tw/handle/123456789/343011
Type
conference paper