Characterize the Mechanical Properties of Ge Nanowires and Polymers with Nano-indentation and Scratch Technologies
Date Issued
2004
Date
2004
Author(s)
Wu, Tsun-Yen
DOI
zh-TW
Abstract
It is said that nano technology is the forth industrial revolution. Along with the arrival of nano era, a lot of nano-scale components or materials have been proposed. Therefore, it is an absolutely necessary task to study the mechanical properties such as Young’s Modulus and hardness, etc. of the materials.
The first objective of this thesis is to investigate the properties of Ge nanowires. The apparatus for investigating Ge nanowires is atomic force microscopy, AFM. And the experiment is based on nanoindentation theory. It is expected to measure the properties of Ge nanowires for the further application in the future.
The main purpose of the experiment is to indent on the Ge nanowires and derive its Young’s Modulus. The first step of the experiment was to calibrate the optical signal to Z piezo actuator displacement constant and the contact area function. Secondly, HCPP, a polymer, was indented with AFM. And the material properties acquired was compared with the data acquired by MTS Nano Indenter to validate the effectiveness of AFM indentation. Finally, Ge nanowires were dispersed evenly onto the wafer which was coated with Au film. By means of different properties possessed by Au and Ge nanowires, whether or not the Ge nanowires had been indented was known. Then the Young’s Modulus of Ge nanowires were shown to be 155GPa.
The second part of this thesis is to characterize the abilities of different polymers to resist abrasion or scratching. Nano Indenter was used to perform scratch tests and Confocal Microscope was used to observe surface conditions of samples. The correlations between different factors such as hardness, Young’s Modulus, Time-dependent effects, shape of scratch tip, velocity and load were studied. The results can be contributed for setting up a sound foundation for building up a math model of scratching.
Subjects
奈米壓印
楊氏模數
原子力顯微鏡
刻劃
鍺奈米線
scratch
Ge nanowire
Nano Indentation
Young’s Modulus
AFM
Type
thesis
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