Current path analysis for electrostatic discharge protection.
Journal
2006 International Conference on Computer-Aided Design, ICCAD 2006, San Jose, CA, USA, November 5-9, 2006
Pages
510-515
Date Issued
2006
Author(s)
Liu, Hung-Yi
Lin, Chung-Wei
Chou, Szu-Jui
Tu, Wei-Ting
Liu, Chih-Hung
Chang, Yao-Wen
Type
conference paper