ML-based Adaptive Wafer Sort to Preserve Diagnostic Information

Journal

2025 IEEE 43rd VLSI Test Symposium (VTS)

Start Page

1-7

Date Issued

2025-04-28

Author(s)

Liu, Yun-Sheng

Liu, Min-Hsin

DOI

10.1109/vts65138.2025.11022782

URI

https://scholars.lib.ntu.edu.tw/handle/123456789/732812

Publisher

IEEE

Type

conference proceedings