Diagnosis of Timing Faults in Scan Chains Using Single Excitation Patterns

Resource

IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences E88-A (4): 1024-1030

Journal

IEICE Transactions on Fundamentals of Electronics

Journal Issue

4

Pages

-

Date Issued

2005

Date

2005

Author(s)

Li, James Chien-Mo

URI

Type

journal article