C-V and G-V characterisation of Ga2O3(Gd2O3)/GaN capacitor with low interface state density

Journal

Electronics Letters

Journal Volume

37

Journal Issue

9

Pages

595-597

Date Issued

2001

Author(s)

Lay, T.S.

Liu, W.D.

Kwo, J.

Mannaerts, J.P.

DOI

10.1049/el:20010403

URI

https://scholars.lib.ntu.edu.tw/handle/123456789/443475

URL

https://www.scopus.com/inward/record.uri?eid=2-s2.0-0035953718&doi=10.1049%2fel%3a20010403&partnerID=40&md5=701204b81af2948e2455e454fe8ce52e

Type

journal article