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College of Engineering / 工學院
Mechanical Engineering / 機械工程學系
Two-dimensional Technology Profiling of Patent Portfolio
Details
Two-dimensional Technology Profiling of Patent Portfolio
Journal
IEEE International Conference on Industrial Engineering and Engineering Management
Journal Volume
2019-December
Pages
1342-1347
Date Issued
2019
Author(s)
Kuan, C.-H.
Tu, W.-M.
DAR-ZEN CHEN
DOI
10.1109/IEEM.2018.8607587
URI
https://scholars.lib.ntu.edu.tw/handle/123456789/447099
URL
https://www.scopus.com/inward/record.uri?eid=2-s2.0-85061774020&doi=10.1109%2fIEEM.2018.8607587&partnerID=40&md5=0a4f304dd4067cc60e027adcede80db0
Type
conference paper
