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College of Electrical Engineering and Computer Science / 電機資訊學院
Electrical Engineering / 電機工程學系
Abnormal hole mobility of biaxial strained Si
Details
Abnormal hole mobility of biaxial strained Si
Resource
Journal of Applied Physics 98 (6): 066104
Journal
Journal of Applied Physics
Journal Volume
98
Journal Issue
6
Pages
-
Date Issued
2005
Date
2005
Author(s)
MING-HAN LIAO
Chang, S. T.
Lee, M. H.
Maikap, S.
CHEE-WEE LIU
DOI
10.1063/1.2041839
URI
http://ntur.lib.ntu.edu.tw//handle/246246/148230
https://www.scopus.com/inward/record.uri?eid=2-s2.0-26244441513&doi=10.1063%2f1.2041839&partnerID=40&md5=d397d5fc044db78ac7ad2c3143628d1c
Type
journal article
File(s)
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Name
58.pdf
Size
125.13 KB
Format
Adobe PDF
Checksum
(MD5):029710a894ff253c17e1a62aee1e2e9d
