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College of Engineering / 工學院
Materials Science and Engineering / 材料科學與工程學系
Plan-view transmission electron microscopy specimen preparation for atomic layer materials using a focused ion beam approach
Details
Plan-view transmission electron microscopy specimen preparation for atomic layer materials using a focused ion beam approach
Journal
Ultramicroscopy
Journal Volume
197
Pages
95-99
Date Issued
2019
Author(s)
Lee, L.-H.
Yu, C.-H.
Wei, C.-Y.
Lee, P.-C.
Huang, J.-S.
Wen, C.-Y.
CHENG-YEN WEN
DOI
10.1016/j.ultramic.2018.12.001
URI
https://scholars.lib.ntu.edu.tw/handle/123456789/491089
URL
https://www.scopus.com/inward/record.uri?eid=2-s2.0-85057748919&doi=10.1016%2fj.ultramic.2018.12.001&partnerID=40&md5=70293c209be01364498e749b09e758e6
SDGs
[SDGs]SDG3
Type
journal article