Deep submicron interconnect timing model with quadratic random variable analysis

Journal

Proceedings -Design, Automation and Test in Europe, DATE

Pages

1091-1094

Date Issued

2008

Author(s)

Zeng, J.-K.

CHUNG-PING CHEN

DOI

10.1109/DATE.2008.4484922

URI

https://scholars.lib.ntu.edu.tw/handle/123456789/501016

URL

https://www.scopus.com/inward/record.uri?eid=2-s2.0-49749152730&doi=10.1109%2fDATE.2008.4484922&partnerID=40&md5=c2feaa5e28f7cb6435847ada133acb8b

Type

conference paper