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College of Electrical Engineering and Computer Science / 電機資訊學院
Electrical Engineering / 電機工程學系
The compatibility analysis of thread migration and DVFS in multi-core processor
Details
The compatibility analysis of thread migration and DVFS in multi-core processor
Journal
Proceedings of the 11th International Symposium on Quality Electronic Design, ISQED 2010
Pages
866-871
Date Issued
2010
Author(s)
Oh, D.
Chen, C.C.P.
Kim, N.
Hu, Y.H.
CHUNG-PING CHEN
DOI
10.1109/ISQED.2010.5450478
URI
https://scholars.lib.ntu.edu.tw/handle/123456789/501046
URL
https://www.scopus.com/inward/record.uri?eid=2-s2.0-77952654634&doi=10.1109%2fISQED.2010.5450478&partnerID=40&md5=4934d59e974f6528abf485b264133abe
Type
conference paper
