ToF-SIMS imaging of the nanoscale phase separation in polymeric light emitting diodes: Effect of nanostructure on device efficiency
Resource
Analyst, 136(4), 716-723
Journal
The Analyst
Pages
716-723
Date Issued
2011
Date
2011
Author(s)
Yu, Bang-Ying
Kuo, Che-Hung
Wang, Wei-Ben
Yen, Guo-Ji
Iida, Shin-ichi
Chen, Sun-Zen
Lin, Wei-Chun
Lee, Szu-Hsian
Kao, Wei-Lun
Liu, Chia-Yi
Chang, Hsun-Yun
You, Yun-Wen
Chang, Chi-Jen
Liu, Chi-Ping
Jou, Jwo-Huei
Shyue, Jing-Jong
Type
journal article
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