Automatic Exposure with Center/Focus Metering
Date Issued
2005
Date
2005
Author(s)
Jhu, Jyun-Sian
DOI
en-US
Abstract
Automatic exposure (AE) controls the light intensity of pictures. In real life, the scenes are too many and diverse to analyze. The common AE metering methods do not work for all scenes, so Nikon’s Automatic Multiple Pattern (AMP) metering algorithm [2] solves these problems. It analyzes large image data, and constructs reference tables. AMP chooses a better metering method by considering weather and contrast conditions. C. C. Yu’s AE metering algorithm [3] solves some problems of AMP method with fuzzy control, subject growing, and multiple reference tables. Our new metering algorithm utilizes the focus information and is simpler and smaller than AMP and C. C. Yu’s algorithms.
Moreover, C. C. Yu proposes an optimal exposure selector (OES) to choose one of pictures with different exposures and to satisfy people preference. We modify the OES factors to achieve precise results.
Moreover, C. C. Yu proposes an optimal exposure selector (OES) to choose one of pictures with different exposures and to satisfy people preference. We modify the OES factors to achieve precise results.
Subjects
自動曝光
對焦
最佳曝光照片選擇演算法
Auto Exposure
Focus
Optimal Exposure Selector
Type
thesis
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