Integrated yield-mining solution with enhanced electrical test data correlation

Resource

Semiconductor Manufacturing, 2003 IEEE International Symposium on

Journal

The Ninth International Symposium on Semiconductor Manufacturing, 2003

Date Issued

2003-10

Date

2003-10

Author(s)

Fan, Chih-Min

Hon, Amos

Wei, John

King, Mingchu

DOI

DOI

1523-553X

URI

Type

journal article

File(s)

Name

01243335.pdf

Size

276.83 KB

Format

Adobe PDF

Checksum

(MD5):c8185fe9f21588050feacf7e11573a04