https://scholars.lib.ntu.edu.tw/handle/123456789/118011
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | CHANG, MING-CHING | en |
dc.contributor.author | Fuh, Chiou-Shann | en |
dc.contributor.author | CHEN, HSIEN-YEI | en |
dc.creator | Chang, Ming-Ching; Fuh, Chiou-Shann; Chen, Hsien-Yei | - |
dc.date | 2001 | en |
dc.date.accessioned | 2009-04-29T03:52:06Z | - |
dc.date.accessioned | 2018-07-05T01:48:16Z | - |
dc.date.available | 2009-04-29T03:52:06Z | - |
dc.date.available | 2018-07-05T01:48:16Z | - |
dc.date.issued | 2001 | - |
dc.identifier.issn | 02180014 | - |
dc.identifier.uri | http://www.scopus.com/inward/record.url?eid=2-s2.0-0035360048&partnerID=MN8TOARS | - |
dc.identifier.uri | http://scholars.lib.ntu.edu.tw/handle/123456789/292179 | - |
dc.identifier.uri | http://ntur.lib.ntu.edu.tw/bitstream/246246/154678/1/26.pdf | - |
dc.description.abstract | This paper presents an efficient general purpose search algorithm for alignment and an applied procedure for IC print mark quality inspection. The search algorithm is based on normalized cross-correlation and enhances it with a hierarchical resolution pyramid, dynamic programming, and pixel over-sampling to achieve subpixel accuracy on one or more targets. The general purpose search procedure is robust with respect to linear change of image intensity and thus can be applied to general industrial visual inspection. Accuracy, speed, reliability, and repeatability are all critical for the industrial use. After proper optimization, the proposed procedure was tested on the IC inspection platforms in the Mechanical Industry Research Laboratories (MIRL), Industrial Technology Research Institute (ITRI), Taiwan. The proposed method meets all these criteria and has worked well in field tests on various IC products. | - |
dc.format | application/pdf | en |
dc.format.extent | 1983229 bytes | - |
dc.format.mimetype | application/pdf | - |
dc.language | en | en |
dc.language.iso | en_US | - |
dc.relation.ispartof | International Journal of Pattern Recognition and Artificial Intelligence15 (4): 675-690 | en_US |
dc.subject | Alignment; Computer vision; Defect detection; Digital image processing; Normalized cross-correlation; Similarity measure; Subpixel accuracy; Visual inspection | - |
dc.title | Fast Search Algorithms for Industrial Inspection | en |
dc.type | journal article | en |
dc.identifier.doi | 10.1142/S0218001401001039 | - |
dc.identifier.scopus | 2-s2.0-0035360048 | - |
item.fulltext | with fulltext | - |
item.grantfulltext | open | - |
dc.relation.pages | 675-690 | - |
dc.relation.journalvolume | 15 | - |
dc.relation.journalissue | 4 | - |
dc.identifier.uri.fulltext | http://ntur.lib.ntu.edu.tw/bitstream/246246/154678/1/26.pdf | - |
item.openairetype | journal article | - |
item.fulltext | with fulltext | - |
item.languageiso639-1 | en_US | - |
item.cerifentitytype | Publications | - |
item.grantfulltext | open | - |
item.openairecristype | http://purl.org/coar/resource_type/c_6501 | - |
crisitem.author.dept | Biomedical Electronics and Bioinformatics | - |
crisitem.author.dept | Networking and Multimedia | - |
crisitem.author.dept | Computer Science and Information Engineering | - |
crisitem.author.dept | Center for Artificial Intelligence and Advanced Robotics | - |
crisitem.author.orcid | 0000-0002-6174-2556 | - |
crisitem.author.parentorg | College of Electrical Engineering and Computer Science | - |
crisitem.author.parentorg | College of Electrical Engineering and Computer Science | - |
crisitem.author.parentorg | College of Electrical Engineering and Computer Science | - |
crisitem.author.parentorg | Others: University-Level Research Centers | - |
顯示於: | 資訊工程學系 |
在 IR 系統中的文件,除了特別指名其著作權條款之外,均受到著作權保護,並且保留所有的權利。