https://scholars.lib.ntu.edu.tw/handle/123456789/119818| Title: | The Effect of Charge-Temperature Aging on n-MOSFET | Authors: | 胡振國 Lin, C. M. 王維新 Hwu, Jenn-Gwo Wang, Way-Seen |
Issue Date: | 1985 | Start page/Pages: | 53-56 | Source: | Proceedings of ROC Electronic Devices and Materials Symposium | URI: | http://ntur.lib.ntu.edu.tw//handle/246246/140565 |
| Appears in Collections: | 光電工程學研究所 |
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