https://scholars.lib.ntu.edu.tw/handle/123456789/120211| Title: | Clockwise C-V Hysteresis Phenomena of Metal-Tantalum Oxide-Silicon-Oxide-Silicon(P) Capacitors Due to Leakage Current Through Tantalum Oxide | Authors: | 胡振國 Jeng, M. J. 王維新 Tu, Y. K. Hwu, Jenn-Gwo Wang, Way-Seen Tu, Y. K. |
Issue Date: | 1987 | Journal Volume: | v.62 n.10 p.4277-4283 | Start page/Pages: | - | Source: | Journal of Applied Physics | URI: | http://ntur.lib.ntu.edu.tw//handle/246246/139816 |
| Appears in Collections: | 光電工程學研究所 |
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