Clockwise C-V Hysteresis Phenomena of Metal-Tantalum Oxide-Silicon-Oxide-Silicon(P) Capacitors Due to Leakage Current Through Tantalum Oxide
Resource
Journal of Applied Physics, v.62 n.10 p.4277-4283
Journal
Journal of Applied Physics
Journal Volume
v.62 n.10 p.4277-4283
Pages
-
Date Issued
1987
Date
1987
Author(s)
Wang, Way-Seen
Type
journal article