https://scholars.lib.ntu.edu.tw/handle/123456789/148922
Title: | OBDD-based network reliability calculation | Authors: | Yeh, Fu-Min Kuo, Sy-Yen |
Keywords: | Reliability theory | Issue Date: | Apr-1997 | Start page/Pages: | - | Source: | Electronics Letters | Abstract: | An efficient method for evaluating the terminal-pair reliability based on an edge expansion tree and using an OBDD (ordered binary decision diagram) is presented. The effectiveness of the algorithm is demonstrated on the larger benchmarks collected in previous work. One notable case of the experimental results for a 2 × 20 lattice network is that the number of nodes in the OBDD is linearly proportional to the number of stages. This is significantly superior to previous algorithms which are based on the sum of disjoint products and has exponential complexity. |
URI: | http://ntur.lib.ntu.edu.tw//handle/246246/2007041910042545 https://www.scopus.com/inward/record.uri?eid=2-s2.0-0031123823&doi=10.1049%2fel%3a19970549&partnerID=40&md5=461b1e18bff61970a2c910b6900645ab |
ISSN: | 00135194 | Other Identifiers: | 0013-5194 | SDG/Keyword: | Algorithms; Boolean functions; Calculations; Decision theory; Failure analysis; Graph theory; Heuristic methods; Probability; Recursive functions; Reliability theory; Ordered binary decision diagram; Terminal pair reliability; Networks (circuits) |
Appears in Collections: | 電機工程學系 |
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00590216.pdf | 320.38 kB | Adobe PDF | View/Open |
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