https://scholars.lib.ntu.edu.tw/handle/123456789/150034
Title: | The Impact of Parallel Architectures Granularity on Yield | Authors: | Fuchs, W. K. Chang, M. F. 郭斯彥 Mazumder, P. Stunkel, C. Kuo, Sy-Yen |
Issue Date: | 1962 | Publisher: | London: Adam Hilger | Journal Volume: | VLSI | Start page/Pages: | - | Source: | Yield Modeling and Defect Tolerance in | URI: | http://ntur.lib.ntu.edu.tw//handle/246246/121648 |
Appears in Collections: | 電機工程學系 |
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