Amorphous silicon edge detector for application to electronic eyes
Resource
Electron Devices Meeting, 1989. Technical Digest., International
Journal
International Electron Devices Meeting, 1989
Pages
-
Date Issued
1989-12
Date
1989-12
Author(s)
DOI
N/A
Abstract
Two types of novel a-Si:H edge detectors, i.e. concentric and directional ones, are successfully fabricated. The measured performance of the edge detector is similar to that of the resistor network Si retina using analog VLSI technology. Two- and three-dimensional architectures of the a-Si:H image detection array combined with the Si VLSI technology are also discussed with application to the preprocessor for a smart vision system.>
SDGs
Type
journal article
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