Amorphous silicon edge detector for application to electronic eyes

Resource

Electron Devices Meeting, 1989. Technical Digest., International

Journal

International Electron Devices Meeting, 1989

Pages

-

Date Issued

1989-12

Date

1989-12

Author(s)

Sah, Wen-Jyh

Chen, Jyh-Hong

DOI

DOI

N/A

URI

Type

journal article

File(s)

Name

00074334.pdf

Size

207.84 KB

Format

Adobe PDF

Checksum

(MD5):11a33577a50ff7fd464cc279c12a5479