https://scholars.lib.ntu.edu.tw/handle/123456789/150859
Title: | Radiation Effects on the Oxide Properties of Silicon MOS Capacitor | Authors: | 胡振國 Lee, G. S. Jeng, M. J. 王維新 李嗣涔 Hwu, Jenn-Gwo Wang, Way-Seen Lee, Si-Chen |
Issue Date: | 1986 | Start page/Pages: | 215-219 | Source: | Electronic Devices and Materials Symposium | URI: | http://ntur.lib.ntu.edu.tw//handle/246246/154401 |
Appears in Collections: | 電機工程學系 |
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