https://scholars.lib.ntu.edu.tw/handle/123456789/153312| Title: | Electrical characterisation of the insulating property of Ta2O5 in Al-Ta2O5-SiO2-Si capacitors by a low-frequency | Authors: | Hwu, J.-G. Lin, S.-T. HwuJG |
Issue Date: | Oct-1990 | Start page/Pages: | - | Source: | Circuits, Devices and Systems, IEE Proceedings G | URI: | http://ntur.lib.ntu.edu.tw//handle/246246/2007041910042720 | ISSN: | N/A | Other Identifiers: | 0956-3768 |
| Appears in Collections: | 電機工程學系 |
| File | Description | Size | Format | |
|---|---|---|---|---|
| 00217100.pdf | 491.57 kB | Adobe PDF | View/Open |
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