https://scholars.lib.ntu.edu.tw/handle/123456789/153830
Title: | A Study of the Leakage Property of Thin Gate Oxides | Authors: | Hwu, Jenn-Gwo | Issue Date: | 1990 | URI: | http://ntur.lib.ntu.edu.tw//handle/246246/153879 |
Appears in Collections: | 電機工程學系 |
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