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College of Electrical Engineering and Computer Science / 電機資訊學院
Electrical Engineering / 電機工程學系
Flat-Band Annealing Behavior of Co-60 Irradiated Silicon MOS Capacitors
Details
Flat-Band Annealing Behavior of Co-60 Irradiated Silicon MOS Capacitors
Date Issued
1989
Date
1989
Author(s)
Hwu, Jenn-Gwo
URI
http://ntur.lib.ntu.edu.tw//handle/246246/153904
Type
report