https://scholars.lib.ntu.edu.tw/handle/123456789/153862| Title: | Improvement in Radiation Hardness of n-MOSFET's with Gate Oxides Prepared by Multiple N20 Annealings | Authors: | 胡振國 Wu, Y. L. Kuo, K. M. Hwu, Jenn-Gwo |
Issue Date: | 1994 | URI: | http://ntur.lib.ntu.edu.tw//handle/246246/153915 |
| Appears in Collections: | 電機工程學系 |
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