https://scholars.lib.ntu.edu.tw/handle/123456789/153866
Title: | Improvement in the Interface Property of Thin Gate Oxide by Successive Irradiation-Then-Anneal Treatments | Authors: | Hwu, Jenn-Gwo | Issue Date: | 1990 | URI: | http://ntur.lib.ntu.edu.tw//handle/246246/153922 |
Appears in Collections: | 電機工程學系 |
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