https://scholars.lib.ntu.edu.tw/handle/123456789/153877
Title: | Radiation Hardness of Coplanar Submicron Gap Charge-Coupled Devices (CCD) with Rapid Thermal Nitrided Oxides | Authors: | 胡振國 Lee, K. C. Hwu, Jenn-Gwo Lee, K. C. |
Issue Date: | 1995 | URI: | http://ntur.lib.ntu.edu.tw//handle/246246/153942 |
Appears in Collections: | 電機工程學系 |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.