https://scholars.lib.ntu.edu.tw/handle/123456789/153879| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 胡振國 | zh-TW |
| dc.contributor.author | Lu, W. S. | zh-TW |
| dc.contributor.author | Hwu, Jenn-Gwo | en |
| dc.creator | Lu, W. S.; Hwu, Jenn-Gwo | - |
| dc.date | 1992 | en |
| dc.date.accessioned | 2009-04-27T04:29:33Z | - |
| dc.date.accessioned | 2018-07-06T15:02:08Z | - |
| dc.date.available | 2009-04-27T04:29:33Z | - |
| dc.date.available | 2018-07-06T15:02:08Z | - |
| dc.date.issued | 1992 | - |
| dc.identifier.uri | http://ntur.lib.ntu.edu.tw//handle/246246/153947 | - |
| dc.language | en | en |
| dc.language.iso | en_US | - |
| dc.title | Radiation Pardness of Rapid Thermal Reoxidized Nitrided Gate Oxides | en |
| dc.type | report | en |
| item.fulltext | no fulltext | - |
| item.grantfulltext | none | - |
| item.cerifentitytype | Publications | - |
| item.languageiso639-1 | en_US | - |
| item.openairetype | report | - |
| item.openairecristype | http://purl.org/coar/resource_type/c_93fc | - |
| crisitem.author.dept | Electrical Engineering | - |
| crisitem.author.dept | Electronics Engineering | - |
| crisitem.author.dept | Electrical Engineering | - |
| crisitem.author.dept | Electronics Engineering | - |
| crisitem.author.orcid | 0000-0001-9688-0812 | - |
| crisitem.author.orcid | 0000-0001-9688-0812 | - |
| crisitem.author.parentorg | College of Electrical Engineering and Computer Science | - |
| crisitem.author.parentorg | College of Electrical Engineering and Computer Science | - |
| crisitem.author.parentorg | College of Electrical Engineering and Computer Science | - |
| crisitem.author.parentorg | College of Electrical Engineering and Computer Science | - |
| Appears in Collections: | 電機工程學系 | |
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