https://scholars.lib.ntu.edu.tw/handle/123456789/154367
Title: | Residual Charges Effect on the Annealing Behavior of Co-60 Irradiated MOS Capacitors | Authors: | Hwu, J.-G. Lee, G. S. Lee, Si-Chen Wang, Way-Seen |
Issue Date: | 1988 | Journal Volume: | 35 | Journal Issue: | 1 | Start page/Pages: | 960-965 | Source: | IEEE Transactions on Nuclear Science | URI: | http://ntur.lib.ntu.edu.tw//handle/246246/120858 | DOI: | 10.1109/23.12867 |
Appears in Collections: | 電機工程學系 |
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