Control and improvement of crystalline cracking from GaN thin films grown on Si by metalorganic chemical vapor deposition

Resource

Thin Solid Films 498 (1-2): 108-112

Journal

Thin Solid Films

Journal Issue

498

Pages

108-112

Date Issued

2006

Date

2006

Author(s)

Yu, J.W.

Lin, H.C.

Feng, Z.C.

Wang, L.S.

Tripathy, S.

Chua, S.J.

URI

Type

journal article

File(s)

Name

17.pdf

Size

605.46 KB

Format

Adobe PDF

Checksum

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