https://scholars.lib.ntu.edu.tw/handle/123456789/155475
Title: | A comparative study of high resolution transmission electron microscopy, atomic force microscopy and infrared spectroscopy for GaN thin films grown on sapphire by metalorganic chemical vapor deposition | Authors: | Feng, Zhe Chuan Li, Kun Hou, Yun Tian Zhao, Jie Lu, W. Collins, W.E. |
Issue Date: | 2006 | Journal Volume: | 200 | Journal Issue: | 10 | Start page/Pages: | 3224-3229 | Source: | Surface and Coatings Technology | URI: | http://ntur.lib.ntu.edu.tw//handle/246246/144201 |
Appears in Collections: | 電機工程學系 |
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