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College of Science / 理學院
Chemistry / 化學系
Polarization-dependent X-ray absorption spectroscopy of La2CuO4Fx thin films using synchrotron radiation
Details
Polarization-dependent X-ray absorption spectroscopy of La2CuO4Fx thin films using synchrotron radiation
Journal
Chinese Journal of Physics
Journal Volume
38
Journal Issue
2
Pages
231-236
Date Issued
2000
Author(s)
Chen, J. M.
Nachimuthu, P.
RU-SHI LIU
Edwards, P. P.
URI
http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=ORCID&SrcApp=OrcidOrg&DestLinkType=FullRecord&DestApp=WOS_CPL&KeyUT=WOS:000086700400006&KeyUID=WOS:000086700400006
http://scholars.lib.ntu.edu.tw/handle/123456789/288823
Type
journal article