https://scholars.lib.ntu.edu.tw/handle/123456789/288950| Title: | Oxide resistance characterization in MOS structures by the voltage decay method | Authors: | JENN-GWO HWU | Issue Date: | 1990 | Journal Volume: | 29 | Journal Issue: | 7 | Start page/Pages: | 1243-1247 | Source: | Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers | URI: | http://www.scopus.com/inward/record.url?eid=2-s2.0-0025454106&partnerID=MN8TOARS http://scholars.lib.ntu.edu.tw/handle/123456789/288950 |
DOI: | 10.1143/JJAP.29.1243 |
| Appears in Collections: | 電機工程學系 |
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