https://scholars.lib.ntu.edu.tw/handle/123456789/288952| Title: | Electrical characterisation of the insulating property of Ta2O5 in Al-Ta2O5-SiO2-Si capacitors by a low-frequency C/V technique | Authors: | JENN-GWO HWU | Issue Date: | 1990 | Journal Volume: | 137 | Journal Issue: | 5 | Start page/Pages: | 390-396 | Source: | IEE proceedings. Part G. Electronic circuits and systems | URI: | http://www.scopus.com/inward/record.url?eid=2-s2.0-0025502620&partnerID=MN8TOARS http://scholars.lib.ntu.edu.tw/handle/123456789/288952 |
| Appears in Collections: | 電機工程學系 |
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