Characterization of FaAs epitaxial layers by low pressure MOVPE using TEG as Ga source

Journal

Journal of Crystal Growth

Journal Volume

55

Journal Issue

1

Pages

24-29

Date Issued

1981

Author(s)

Chang, C.Y.

Su, Y.K.

Lee, M.K.

Chen, L.G.

Houng, M.P.

DOI

10.1016/0022-0248(81)90266-9

URI

http://www.scopus.com/inward/record.url?eid=2-s2.0-49049152584&partnerID=MN8TOARS

http://scholars.lib.ntu.edu.tw/handle/123456789/292113

Type

journal article