https://scholars.lib.ntu.edu.tw/handle/123456789/292421| Title: | Improvement of hot-carrier resistance and radiation hardness of nMOSFETs by irradiation-then-anneal treatments | Authors: | Chang-Liao, K.-S. Hwu, J.-G. JENN-GWO HWU |
Issue Date: | 1991 | Journal Volume: | 34 | Journal Issue: | 7 | Start page/Pages: | 761-764 | Source: | Solid State Electronics | URI: | http://www.scopus.com/inward/record.url?eid=2-s2.0-0026188024&partnerID=MN8TOARS http://scholars.lib.ntu.edu.tw/handle/123456789/292421 |
DOI: | 10.1016/0038-1101(91)90015-Q |
| Appears in Collections: | 電機工程學系 |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.