https://scholars.lib.ntu.edu.tw/handle/123456789/292421
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Chang-Liao, K.-S. | en_US |
dc.contributor.author | JENN-GWO HWU | en_US |
dc.creator | Chang-Liao, K.-S.;Hwu, J.-G. | - |
dc.date.accessioned | 2018-09-10T03:44:49Z | - |
dc.date.available | 2018-09-10T03:44:49Z | - |
dc.date.issued | 1991 | - |
dc.identifier.uri | https://www.scopus.com/inward/record.uri?eid=2-s2.0-0026188024&doi=10.1016%2f0038-1101%2891%2990015-Q&partnerID=40&md5=f313931e88c26e953a6327c64121ac08 | - |
dc.identifier.uri | http://scholars.lib.ntu.edu.tw/handle/123456789/292421 | - |
dc.description.abstract | The improvement of hot-carrier resistance and radiation hardness in n-channel MOSFETs by a novel technique is studied. This technique includes a Co-60 (1 M rad) irradiation and a subsequent anneal in N2 at 400°C for 10 min. The hot-carrier-induced instability and the radiation-induced degradation in MOSFETs are examined from the shifts of threshold voltage, transconductance, and drain current. It is observed that the sample after irradiation-then-anneal treatment shows more resistance to hot carrier and radiation damage than that without treatment. The effects are explained by a model involving strain relaxation induced near the SiO2/Si interface by irradiation. © 1991. | - |
dc.language | en | en |
dc.relation.ispartof | Solid State Electronics | en_US |
dc.source | AH | - |
dc.subject.other | Semiconductor Materials--Charge Carriers; Hot-carrier resistance; n-channel MOSFET; Semiconductor Devices, MOSFET | - |
dc.title | Improvement of hot-carrier resistance and radiation hardness of nMOSFETs by irradiation-then-anneal treatments | - |
dc.type | journal article | en |
dc.identifier.doi | 10.1016/0038-1101(91)90015-Q | - |
dc.identifier.scopus | 2-s2.0-0026188024 | - |
dc.relation.pages | 761-764 | - |
dc.relation.journalvolume | 34 | - |
dc.relation.journalissue | 7 | - |
item.cerifentitytype | Publications | - |
item.grantfulltext | none | - |
item.fulltext | no fulltext | - |
item.openairecristype | http://purl.org/coar/resource_type/c_6501 | - |
item.openairetype | journal article | - |
crisitem.author.dept | Electrical Engineering | - |
crisitem.author.dept | Electronics Engineering | - |
crisitem.author.orcid | 0000-0001-9688-0812 | - |
crisitem.author.parentorg | College of Electrical Engineering and Computer Science | - |
crisitem.author.parentorg | College of Electrical Engineering and Computer Science | - |
顯示於: | 電機工程學系 |
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