A comprehensive study of inversion current in MOS tunneling diodes

Journal

IEEE Transactions on Electron Devices

Journal Volume

48

Journal Issue

9

Pages

2125-2130

Date Issued

2001

Author(s)

Lin, C.-H.

Hsu, B.-C.

Lee, M.H.

DOI

10.1109/16.944205

URI

http://www.scopus.com/inward/record.url?eid=2-s2.0-0035445463&partnerID=MN8TOARS

http://scholars.lib.ntu.edu.tw/handle/123456789/293634

Type

journal article