https://scholars.lib.ntu.edu.tw/handle/123456789/296941
Title: | Performance prediction and function recovery of CMOS circuits damaged by Co-60 irradiation | Authors: | Chang-Liao, K.-S. Hwu, J.-G. JENN-GWO HWU |
Issue Date: | 1992 | Journal Volume: | 139 | Journal Issue: | 3 | Start page/Pages: | 319-324 | Source: | IEE Proceedings, Part G: Circuits, Devices and Systems | URI: | http://www.scopus.com/inward/record.url?eid=2-s2.0-0026881848&partnerID=MN8TOARS http://scholars.lib.ntu.edu.tw/handle/123456789/296941 |
Appears in Collections: | 電機工程學系 |
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