A simple method for the determination of noise coefficients P, R, and C by two port noise parameters
Journal
Microwave and Optical Technology Letters
Journal Volume
35
Journal Issue
2
Pages
129-132
Date Issued
2002
Author(s)
Abstract
Abstract In this paper, a simple method for the determination of noise coefficients P, R, and C by standard two‐port noise parameters, F min , R N and Γ opt is presented. The relation between equivalent noise resistance R N and equivalent noise conductance g n has been derived, which greatly simplifies the extraction procedure. This method has been applied to the extraction of K g /K c /K r and P/R/C from 0.15 μm InGaAs PHEMT's with three different sizes at two different biases. Excellent agreement between measured and calculated noise parameters has been found. The tendency of the extracted values with respect to device size and bias is also discussed. © 2002 Wiley Periodicals, Inc. Microwave Opt Technol Lett 35: 129–132, 2002; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.10536
SDGs
Type
journal article