OBDD-based Evaluation of K-terminal Network Reliability

Journal

IEEE Transactions on Reliability

Journal Volume

51

Journal Issue

4

Pages

443-451

Date Issued

2002-12

Author(s)

F. M. Yeh

S. K. Lu

DOI

10.1109/TR.2002.804736

URI

http://scholars.lib.ntu.edu.tw/handle/123456789/299128

Type

journal article