https://scholars.lib.ntu.edu.tw/handle/123456789/299128
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | F. M. Yeh | en_US |
dc.contributor.author | S. K. Lu | en_US |
dc.contributor.author | S. Y. Kuo | en_US |
dc.contributor.author | SY-YEN KUO | zz |
dc.creator | F. M. Yeh;S. K. Lu;S. Y. Kuo | - |
dc.date.accessioned | 2018-09-10T04:15:11Z | - |
dc.date.available | 2018-09-10T04:15:11Z | - |
dc.date.issued | 2002-12 | - |
dc.identifier.uri | http://scholars.lib.ntu.edu.tw/handle/123456789/299128 | - |
dc.language | en | en |
dc.relation.ispartof | IEEE Transactions on Reliability | en_US |
dc.source | AH-anncc | - |
dc.title | OBDD-based Evaluation of K-terminal Network Reliability | - |
dc.type | journal article | en |
dc.identifier.doi | 10.1109/TR.2002.804736 | - |
dc.identifier.scopus | 2-s2.0-0036891352 | - |
dc.identifier.isi | WOS:000178991400009 | - |
dc.relation.pages | 443-451 | - |
dc.relation.journalvolume | 51 | - |
dc.relation.journalissue | 4 | - |
item.openairetype | journal article | - |
item.fulltext | no fulltext | - |
item.openairecristype | http://purl.org/coar/resource_type/c_6501 | - |
item.grantfulltext | none | - |
item.cerifentitytype | Publications | - |
crisitem.author.dept | Electrical Engineering | - |
crisitem.author.dept | Electronics Engineering | - |
crisitem.author.dept | Networking and Multimedia | - |
crisitem.author.dept | Computer Science and Information Engineering | - |
crisitem.author.dept | Center for Quantum Science and Engineering (CQSE) | - |
crisitem.author.orcid | 0000-0002-2504-2608 | - |
crisitem.author.parentorg | College of Electrical Engineering and Computer Science | - |
crisitem.author.parentorg | College of Electrical Engineering and Computer Science | - |
crisitem.author.parentorg | College of Electrical Engineering and Computer Science | - |
crisitem.author.parentorg | College of Electrical Engineering and Computer Science | - |
crisitem.author.parentorg | Others: University-Level Research Centers | - |
顯示於: | 電機工程學系 |
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