https://scholars.lib.ntu.edu.tw/handle/123456789/301812| Title: | Thickness-dependent stress effect in p-type metal-oxide-semiconductor structure investigated by substrate injection current | Authors: | JENN-GWO HWU | Issue Date: | 2003 | Journal Volume: | 82 | Journal Issue: | 22 | Start page/Pages: | 3916-3918 | Source: | Applied Physics Letters | URI: | http://www.scopus.com/inward/record.url?eid=2-s2.0-0038307299&partnerID=MN8TOARS http://scholars.lib.ntu.edu.tw/handle/123456789/301812 |
DOI: | 10.1063/1.1581004 |
| Appears in Collections: | 電機工程學系 |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.